• Hyper Fast Recovery: 35nsec Maximum • High Surge Rating • Low Reverse Leakage Current • Low Junction Capacitance • Hermetically Sealed • Eutectic Die Attach • Enhanced Replacement for UES2604-06 series • High Reliability Device, Screened to 25 Temperature Cycles (-55 to +175°C) and 48 hrs of HTRB (320V, 150°C)